Photonic Systems Integration
Your Solution for Custom Ellipsometry
Customization
Photonic Sytems Integration can provide custom spectroscopic ellipsometers to fit a wide variety of applications. Our experienced engineering team will be glad to help you with customization. Call us at +1-407-732-0987 or send us a mail to sales@psieng.com.
High Precision
The film thickness of most transparent thin films from 0 – 1000 nm can be determined with excellent precision and accuracy by a simple 1 second measurement. Optical constants n & k and other film properties can also be measured for many samples.
Affordable
Photonic Systems Integration provides cost-effective optical solutions. Our custom ellipsometers are affordable, low cost, but advanced and high performance tools. Our ellipsometers are ideal for measurements in the research lab, classroom, in situ process chambers, industrial quality control, and more.
Customization
Powerful & Innovative
Affordable
Providing the best optical solutions and great support
full range of ellipsometers for thin film thickness measurements, optical characterization for refractive index and extinction coefficient analysis.
custom spectroscopic ellipsometers to fit a wide variety of applications.
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